Published date:Oct 08 2018

Journal Title: KnE Engineering

Issue title: Breakthrough directions of scientific research at MEPhI: Development prospects within the Strategic Academic Units

Pages:97–99

DOI: 10.18502/keg.v3i6.2978

A S Bakerenkov

Y R Shaltaeva

A S Rodin

N S Glukhov

V A Felitsyn

A I Zhukov

The schematic method development of radiation degradation compensation of operating amplifiers’ input currents and offset voltages on basis of radiation-sensitive parameter degradation research of integral microcircuits and discrete transistors is presented and experimentally verified.

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