KnE Engineering
ISSN: 2518-6841
The latest conference proceedings on all fields of engineering.
X-ray Diffraction Investigation of Sio2/Si Track Templates with Deposited Zn
Published date: May 07 2018
Journal Title: KnE Engineering
Issue title: Russian Forum of Young Scientists (RFYS)
Pages: 39–45
Authors:
Abstract:
Si/SiO2 /Zn structures are fabricated by the track template synthesis. SEM and AFM images of the surface after electrochemical deposition of zinc were obtained. XRD analysis of the deposited samples showed the creation of zinc oxide nanocrystals with Miller indexes (200) at θ=62,30 and (201) at θ=69,50 (PDF#361451-etalon).
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