KnE Engineering
ISSN: 2518-6841
The latest conference proceedings on all fields of engineering.
Modernization of the Data Processing Device for the Boron Concentration Meter
Published date: Feb 21 2018
Journal Title: KnE Engineering
Issue title: XIII International Youth Scientific and Practical Conference "FUTURE OF ATOMIC ENERGY - AtomFuture 2017"
Pages: 70-79
Authors:
Abstract:
Currently all nuclear power plants with VVER -reactors used data measuring systems called a Boron Concentration Meter (NAR). They are necessary for the boron control implementation. NAR consists of sensors and auxiliary devices, and it includes the device of storage and data processing (UNO). Both the rapid evolution of computer architectures, and associated microprocessor hardware updates in the electronics market create a necessity of a new device development. The main design goals both are to optimize the hardware solutions and to use a new software and algorithmic capabilities. However, another development goal is not only the upgrading of circuitry and software, but the optimization of calibration process in the NAR and testing it.
References:
[1] Official website of ROSATOM State Atomic Energy Corporation. About us. URL: http://www.rosatom.ru/en/about-us/
[2] V.A. Sidorenko. Voprosy bezopasnosti raboty reactorov VVER. – М.: Atomizdat, 1977.
[3] N.P. Kuzelev, G.I. Kiryanov, A.G. Chuev, S.V. Shagov, A.S. Shtan etc.. Konceptsiya monitoringa I apparatura dlya izmereniya koncentracii izotopa 10В v teplonositele I technologicheskikh rastvorakh VVER-reactorov s tseliyu povyshenija jadernoy bezopasnosti I nadyozhnosti AES. – Tyazheloye mashinostroenije, №9, 2005, p. 13- 16.
[4] V.P. Bovin, V.L. Chulkin, S.V. Shagov. Neitronno-absorbtsionny analizator borav teplonositele pervogo kontura VVER. – Atomnaya energiya, т. 38, vyp. 5, 1975, p. 283-286.
[5] D. Foreman., P. Stockwell. Automatic Chemical Analysis. Per. s angl. – М.: Mir, 1978.
[6] K. H. Beckurts, K. Wirtz. Neutron physics. Per. s. angl. – М.: Atomizdat, 1968.
[7] B.I. Krasnov, E.P. Minaikin, E.G. Ponomarev, A.G. Chuev. K voprosu vybora mwtodiki opredeleniya soderzhaniya khimicheskikh elementov i ikh izotopov pri neitronno-absorbtsionnom analize tekhnologicheskikh produktov. – Nauchnaya sessiya MEPhI-2002. Sbornik nauchnykh trudov, Т. 5. – М.: MEPhI, 2002.
[8] L. Yanosh. Teoriya i praktika obrabotki rezultatov izmerenij. Per. s angl. pod red. A.P. Kleshkova. – М.: Mir, 1968.
[9] Tablitsy fizicheskikh velichin. Spravochnik pod red. akad. I.K. Kikoina. – М.: Atomizdat, 1976.
[10] V.I. Kalashnikova, M.S. Kozodaev. Detektory elementrnykh chastits. – М.: Nauka, 1966.
[11] R. Popov. Obzor yadra ARM Cortex-M4. Compel. URL: https://www.compel.ru/wordpress/wp-content/uploads/2012/10/STM32F4- YAdro-Cortex-M4.pdf
[12] V.I. Bugaev, M.P. Musienko, Ya.M. Krainykh. Laboratorny praktikum po izucheniyu mikrokontrollerov STM32 na baze otladochnykh modulej STM32F3 Discovery и STM32F4 Discovery Mockav – Nikolaev: MIPT-ChGU, 2014. – 26 p.
[13] I.B. Burdonov, A.S. Kosachev, V.N. Ponomarenko. Operatsionnie sistamy realnogo vremeni – Preprinty instituta sistemnogo programmirovaniya RAN, Preprint 14, 2006, P. 1-98.
[14] A.S. Batuev, B.I. Krasnov, E.G. Ponomarev, A.G. Chuev. Issledovanie vliyaniya temperatury rastvora bornoy kisloty na rezultaty analiza neitronno-absobtsionnym metodom. – VANT. Ser. Tekhnicheskaya fizika I avtomatizatsiya. Vyp. 56, TsNIIAI, 2002, P. 16-22.
[15] ATtiny24/44/84 8-bit Microcontroller with 2/4/8K Bytes In-System Programmable Flash. Datasheet. URL: http://www.atmel.com/images/doc8006.pdf
